Semiconductor Backend

DFT

Our design supports DFT architecture, a vital aspect of semiconductor design that ensures efficient and reliable testing of chips during manufacturing. It employs advanced methodologies like scan, MBIST and LBIST to enhance test coverage, reduce costs, and improve product quality. Our cutting-edge DFT solutions enable seamless integration and deliver high performance in silicon designs. With a focus on innovation, we create robust and testable designs to meet industry demands.

Synthesis

We specializes in delivering synthesis solutions, transforming high-level RTL designs into optimized gate-level implementations that meet manufacturable standards.We focus on achieving performance optimization, power reduction, and resource management while strictly adhering to design rules and technology constraints.Utilizing industry-leading tools like Design Compiler, Genus, and Fusion Compiler, we ensure robust multi-mode, multi-corner (MMMC) design optimization for advanced technology nodes.Our team excels in addressing critical challenges such as timing closure, power optimization using clock gating and multi-threshold cells, and efficient handling of Engineering Change Orders (ECOs).By integrating design-for-test (DFT) features, leveraging Unified Power Format (UPF) strategies, and collaborating across design teams, we deliver scalable synthesis solutions for applications in high-performance computing, automotive systems, and IoT devices.

Static Time Analysis

Static Time Analysis (STA) is a crucial methodology used to analyze and optimize the performance of digital circuits. It involves calculating the maximum time required for signals to propagate through a circuit, ensuring that the design meets the necessary timing constraints for reliable operation. By identifying timing violations, such as setup or hold time issues, STA helps to verify that a circuit will function correctly under all operating conditions without requiring physical testing. This analysis is essential for optimizing design efficiency, reducing errors, and ensuring high-performance outcomes in semiconductor development.